• DocumentCode
    1384545
  • Title

    MFM studies of recording phenomena in high density longitudinal recordings

  • Author

    Glijer, Pawef ; Abarra, E. Noel ; Kisker, Holger ; Suzuki, Takao

  • Author_Institution
    Inf. Storage Mater. Lab., Toyota Technol. Inst., Nagoya, Japan
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3557
  • Lastpage
    3562
  • Abstract
    The Magnetic Force Microscopy (MFM) technique is demonstrated to provide quantitative information on not only micromagnetics but also on recording performance. A novel method is introduced for analyzing MFM images of recorded bit patterns to determine recording parameters such as signal and signal-to-noise ratio. The results are compared with those measured by a read head. Both signal and signal-to-noise ratio are found to be higher in the CoCrTaPt/CrMo medium than in CoCrTa/Cr medium for linear densities greater than 150 kfci. Recorded patterns can be observed in CoCrTaPt for linear densities up to 370 kfci while the patterns in CoCrTa start to deteriorate for densities higher than 250 kfci. Better high density performance of CoCrTaPt results from the finer structure of an isolated recorded transition which is attributed to reduced magnetostatic and exchange intergranular interactions. The direct overwrite patterns for CoCrTaPt exhibit narrower erase bands and less interactions between the old and new data; the overwrite at 232 kfci is 28 dB
  • Keywords
    chromium alloys; cobalt alloys; magnetic force microscopy; magnetic recording; microscopy; titanium alloys; CoCrTa-Cr; CoCrTaPt-CrMo; MFM imaging; bit pattern; direct overwrite pattern; exchange intergranular interactions; high density longitudinal recording; isolated transition; linear density; magnetic force microscopy; magnetostatic intergranular interactions; micromagnetics; signal; signal-to-noise ratio; Head; Image analysis; Magnetic analysis; Magnetic force microscopy; Magnetic forces; Magnetic recording; Micromagnetics; Pattern analysis; Signal analysis; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538689
  • Filename
    538689