Effect of substrate texture on thin film disk noise

Author

Xing, Xinzhi ; Lin, G. Herbert ; Johnson, Kenneth E. ; Bertram, H. Neal

Author_Institution

Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

3575

Lastpage

3577

Abstract

In this work, the effects of substrate texture on thin film disk noise have been studied, via recording spectral analysis. Both the total texture noise power and spectral shape were found to be dependent upon not only the texture, but also the recording density. An analytical expression for the texture noise spectrum was derived by relating texture noise to the disk surface topography. It was found that the texture noise can be characterized by the texture roughness σ_p and the down-track correlation length I. The values of l and σ_p were determined by fitting the theoretical expression with the measured spectrum. AFM measurements were also performed to examine the surface structure of the textured disk. The results agree with that of the recording spectral analysis

Keywords

atomic force microscopy; digital magnetic recording; magnetic disc storage; magnetic film stores; magnetic recording noise; spectral analysis; surface texture; surface topography; AFM measurements; disk surface topography; down-track correlation length; high density digital magnetic storage devices; modulation noise; recording density; recording spectral analysis; spectral shape; substrate texture effect; surface structure; texture noise spectrum; texture roughness; thin film disk noise; total texture noise power; Disk recording; Noise shaping; Rough surfaces; Spectral analysis; Spectral shape; Substrates; Surface fitting; Surface roughness; Surface texture; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.538694

Filename

538694