• DocumentCode
    1384902
  • Title

    Control and observation structures for analog circuits

  • Author

    Yeong-Ruey Sheh ; Wu, Cheng-Wen

  • Author_Institution
    Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    15
  • Issue
    2
  • fYear
    1998
  • Firstpage
    56
  • Lastpage
    64
  • Abstract
    No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy
  • Keywords
    built-in self test; calibration; design for testability; DC voltage levels; analog circuits; built-in self-test method; calibration process; control structures; observation structures; Analog circuits; Analog memory; Automatic testing; Built-in self-test; Calibration; Circuit testing; Digital circuits; Hardware; Signal resolution; Switches;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.679208
  • Filename
    679208
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1384902