Title :
Functional fault models for analog circuits
Author :
Malyshenko, Yuri V.
Author_Institution :
Vladivostok, Russia
Abstract :
For devices containing analog integrated circuits, the appropriate fault models are those that describe components at the functional level. Functional models proposed in the past have been too complicated for practical use. The models proposed here form the basis of simpler test selection techniques for analog ICs
Keywords :
analogue integrated circuits; integrated circuit testing; analog integrated circuits; functional fault models; test selection techniques; Analog circuits; Analog computers; Analog integrated circuits; Circuit faults; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Q measurement; Sufficient conditions;
Journal_Title :
Design & Test of Computers, IEEE
