DocumentCode :
1384983
Title :
Method and Apparatus for Continuous 
Examination of HTS Tape Using Magnetic Circuit
Author :
Gu, Chen ; Qu, Timing ; Zou, Shengnan ; Han, Zhenghe
Author_Institution :
Appl. Supercond. Res. Center, Tsinghua Univ., Beijing, China
Volume :
21
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
3413
Lastpage :
3416
Abstract :
A new method based on the principle of magnetic circuits is proposed and realized for continuous Ic examination of HTS tapes. The greatest advantages of the new method are that it first eliminates all the noise caused by mechanical fluctuations, and thus makes high speed and high stability measurement possible, and second has a natural ability to measure HTS tape with a magnetic substrate. The principle of the method is introduced with the help of Finite Element Analysis. An apparatus for examination of kilometer long tapes has been constructed, by which continuous Ic examination for a YBa2Cu3O7-x tape with and without a magnetic substrate and a Bi2Si2Ca2Cu3Ox multi-filamentary tape is reported.
Keywords :
barium compounds; bismuth compounds; calcium compounds; critical currents; electric current measurement; finite element analysis; high-temperature superconductors; magnetic circuits; multifilamentary superconductors; silicon compounds; superconducting tapes; yttrium compounds; Bi2223 multifilamentary tape; Bi2Si2Ca2Cu3Ox; HTS tape; YBCO tape; YBa2Cu3O7-x; continuous Ic examination; critical current measurement; finite element analysis; high speed measurement; high stability measurement; magnetic circuit; magnetic substrate; mechanical fluctuations; Current measurement; Magnetic circuits; Magnetic cores; Noise; Superconducting magnets; Yttrium barium copper oxide; Contactless; HTS tape; continuous measurement; magnetic circuit;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2090033
Filename :
5641594
Link To Document :
