• DocumentCode
    1385021
  • Title

    A high-sensitivity z-axis capacitive silicon microaccelerometer with a torsional suspension

  • Author

    Selvakumar, Arjun ; Najafi, Khalil

  • Author_Institution
    Input/Output Inc., Stafford, TX, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    192
  • Lastpage
    200
  • Abstract
    This paper presents a new z-axis high-sensitivity silicon-micromachined capacitive accelerometer fabricated using a three-mask dissolved-wafer process (DWP). It employs capacitive sensing using overlap-area variations between comb electrodes and a torsional suspension system to provide high sensitivity without compromising bandwidth, full-scale range, or the pull-in voltage ceiling. Excellent electrical sensitivity is obtained by using high-aspect-ratio comb fingers with narrow air gaps of 2 μm and a large overlap area of 12 μm ×300 μm. Torsional suspension beams 150 μm long with a cross-sectional area of 12 μm ×3 μm are used to improve the mechanical gain. Simulations of the capacitance between sense fingers show a highly linear region over a wide 14-μm tip deflection range. Accelerometers were fabricated and yielded sensitivities of 263-300 mV/g, a nonlinearity less than 0.2% over a range of -4 to +3 g, a full-scale range of -4 to +6 g, and pull-in voltages greater than 8 V. A 3 dB cutoff frequency of 35 Hz was measured in air. The calculated thermomechanical noise in the sensor is 0.28 mg over this bandwidth
  • Keywords
    accelerometers; capacitance measurement; elemental semiconductors; micromachining; microsensors; noise; sensitivity; silicon; 2 to 300 micron; 35 Hz; 8 V; Si; capacitive sensing; comb electrodes; electrical sensitivity; high-aspect-ratio comb fingers; high-sensitivity Si microaccelerometer; micromachined capacitive accelerometer; narrow air gaps; overlap-area variations; three-mask dissolved-wafer process; torsional suspension; z-axis capacitive microaccelerometer; Accelerometers; Air gaps; Bandwidth; Capacitance; Cutoff frequency; Electrodes; Fingers; Frequency measurement; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.679356
  • Filename
    679356