DocumentCode :
1385021
Title :
A high-sensitivity z-axis capacitive silicon microaccelerometer with a torsional suspension
Author :
Selvakumar, Arjun ; Najafi, Khalil
Author_Institution :
Input/Output Inc., Stafford, TX, USA
Volume :
7
Issue :
2
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
192
Lastpage :
200
Abstract :
This paper presents a new z-axis high-sensitivity silicon-micromachined capacitive accelerometer fabricated using a three-mask dissolved-wafer process (DWP). It employs capacitive sensing using overlap-area variations between comb electrodes and a torsional suspension system to provide high sensitivity without compromising bandwidth, full-scale range, or the pull-in voltage ceiling. Excellent electrical sensitivity is obtained by using high-aspect-ratio comb fingers with narrow air gaps of 2 μm and a large overlap area of 12 μm ×300 μm. Torsional suspension beams 150 μm long with a cross-sectional area of 12 μm ×3 μm are used to improve the mechanical gain. Simulations of the capacitance between sense fingers show a highly linear region over a wide 14-μm tip deflection range. Accelerometers were fabricated and yielded sensitivities of 263-300 mV/g, a nonlinearity less than 0.2% over a range of -4 to +3 g, a full-scale range of -4 to +6 g, and pull-in voltages greater than 8 V. A 3 dB cutoff frequency of 35 Hz was measured in air. The calculated thermomechanical noise in the sensor is 0.28 mg over this bandwidth
Keywords :
accelerometers; capacitance measurement; elemental semiconductors; micromachining; microsensors; noise; sensitivity; silicon; 2 to 300 micron; 35 Hz; 8 V; Si; capacitive sensing; comb electrodes; electrical sensitivity; high-aspect-ratio comb fingers; high-sensitivity Si microaccelerometer; micromachined capacitive accelerometer; narrow air gaps; overlap-area variations; three-mask dissolved-wafer process; torsional suspension; z-axis capacitive microaccelerometer; Accelerometers; Air gaps; Bandwidth; Capacitance; Cutoff frequency; Electrodes; Fingers; Frequency measurement; Silicon; Voltage;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.679356
Filename :
679356
Link To Document :
بازگشت