Title :
A novel integrated silicon capacitive microphone-floating electrode “electret” microphone (FEEM)
Author :
Zou, Quanbo ; Tan, Zhimin ; Wang, Zhenfeng ; Pang, Jiangtao ; Qian, Xin ; Zhang, Qingxin ; Lin, Rongming ; Yi, Sung ; Gong, Haiqing ; Liu, Litian ; Li, Zhijian
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore
fDate :
6/1/1998 12:00:00 AM
Abstract :
A novel principle “electret” microphone, i.e., floating electrode electret microphone, is proposed and implemented in this study. Single-chip fabrication and corrugation technique are used in the design and fabrication of the microphone. The floating electrode is encapsulated by highly insulated materials to ensure that there is no electric-leakage passage between the floating electrode and the electrodes of the microphone. Net-free electronic charges (not “bonded” charges as in traditional electret) in the floating electrode can excite the electric field, which is similar to that of the traditional electret. The floating electrode can be easily charged by use of the “hot” electron technique, available using the avalanche breakdown of the p+-n junction. Therefore, the electret microphone is rechargeable, which can greatly increase the lifetime of the device. The preamplifier has been on-chip integrated in a junction-field-effect transistor (JFET) source-follower type with resistors by use of ion implantation. Electret charges are banded in a deep potential trap, thus, this microphone can operate at a high temperature (as high as 300°C) and has high stability and reliability. Experiments show that the prototype has a 3-mV/Pa sensitivity and a larger than 21-kHz frequency bandwidth in a 1 mm ×1-mm diaphragm area. Microphone performance can be further improved by optimized process and design. The fabrication is completely integrated-circuit (IC) compatible, hence, the microphone shows promise in integrated acoustic systems
Keywords :
electrets; elemental semiconductors; micromachining; microphones; silicon; 21 kHz; 300 C; FEEM; JFET source-follower type preamplifier; Si; avalanche breakdown; corrugated diaphragm; encapsulation; floating electrode electret microphone; hot electron technique; integrated acoustic system; ion implantation; micromachining; p+-n junction; rechargeable device; resistor; silicon capacitive microphone; single-chip fabrication; Avalanche breakdown; Dielectrics and electrical insulation; Electrets; Electrodes; Electrons; Fabrication; Microphones; Preamplifiers; Resistors; Silicon;
Journal_Title :
Microelectromechanical Systems, Journal of