Cascade self-induced holography: a new grating fabrication technology for DFB/DBR lasers and WDM laser arrays

Author

Lin, C.H. ; Zhu, Z.H. ; Qian, Y. ; Lo, Y.H.

Author_Institution

Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA

Volume

32

Issue

10

fYear

1996

fDate

10/1/1996 12:00:00 AM

Firstpage

1752

Lastpage

1759

Abstract

A method of fabricating submicron gratings for optoelectronic devices from a glass mask was proposed and demonstrated. The glass mask has gratings on both sides with a period of at least four times the final feature size. By introducing an offset to the grating periods on the mask, one can achieve multiple-period gratings with a very fine period spacing for advanced wavelength-division multiplexing (WDM) devices. In this paper, we demonstrated 0.5-μm second-order gratings for 1.55-μm DFB lasers and gratings with a 6-Å period difference for a four-channel WDM laser array using only optical sources. The Moire pattern caused by the spatial frequency beating was also observed and discussed. The Moire pattern could serve as an effective tool to measuring wavelength channel spacing between devices with an unprecedented (0.1 Å) resolution

Keywords

distributed Bragg reflector lasers; distributed feedback lasers; holographic gratings; masks; moire fringes; optical communication equipment; optical fabrication; semiconductor laser arrays; wavelength division multiplexing; μm DFB lasers; 0.5 mum; 1.55 mum; DBR lasers; DFB lasers; Moire pattern; WDM devices; WDM laser arrays; cascade self-induced holography; final feature size; fine period spacing; four-channel WDM laser array; glass mask; grating fabrication technology; grating periods; multiple-period gratings; optical sources; optoelectronic devices; resolution; second-order gratings; spatial frequency beating; submicron gratings; wavelength channel spacing; wavelength-division multiplexing; Frequency; Glass; Gratings; Holographic optical components; Holography; Optical arrays; Optical device fabrication; Optoelectronic devices; Wavelength division multiplexing; Wavelength measurement;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.538781

Filename

538781