Curve fitting and error modeling for the digitization process near the Nyquist rate

Author

Baumgart, Chris W. ; Dunham, Mark E. ; Moses, John D.

Author_Institution

EG&G Energy Measurements Inc., Los Alamos, NM, USA

Volume

40

Issue

3

fYear

1991

fDate

6/1/1991 12:00:00 AM

Firstpage

553

Lastpage

557

Abstract

Model-based parametric estimation (MBPE) techniques are used to numerically examine the limits of waveform digitization errors. MBPE has proven very successful for the effective bits test of digitizer accuracy, and it is shown that it is a strong candidate for reconstruction whenever some a priori information is available. The numerical results aid in the optimum use of modern transient recorders to their full analog bandwidth capability. The model may be used either as a tool in understanding absolute performance capability for the highly nonlinear space near the Nyquist limit or as a practical experimental aid when setting specifications for a real measurement

Keywords

Nyquist criterion; analogue-digital conversion; curve fitting; error analysis; parameter estimation; transient analysers; waveform analysis; Nyquist limit; Nyquist rate; analogue digital conversion; curve fitting; error modeling; model based parametric estimation; nonlinear space; real measurement; reconstruction; transient digitisation; transient recorders; waveform digitization errors; Bandwidth; Curve fitting; Energy measurement; Frequency; Helium; Interpolation; Quantization; Sampling methods; Signal resolution; Testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.87018

Filename

87018