Title :
Microcracks of the thin-film head alumina: “L” cracks and “U” cracks
Author :
Chekanov, A.S. ; Low, T.S. ; Alli, S. ; Kolosov, O. ; Briggs, A.
Author_Institution :
Data Storage Inst., Nat. Univ. of Singapore, Singapore
fDate :
9/1/1996 12:00:00 AM
Abstract :
Two different types of microcracks in thin film head alumina were observed: cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina
Keywords :
alumina; atomic force microscopy; magnetic heads; magnetic recording; magnetic thin film devices; microcracks; Al2O3; L cracks; U cracks; corrosion; damage; degradation; magnetic head; microcracks; pole tip; read/write performance; subsurface structure; thermally induced cracks; thin-film head alumina; ultrasonic AFM; Corrosion; Magnetic heads; Magnetic materials; Magnetic recording; Memory; Resists; Space vector pulse width modulation; Surfaces; Thermal degradation; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
