DocumentCode :
1385225
Title :
Improving conduction and mechanical reliability of woven metal interconnects
Author :
Bhattacharya, Rabin ; Van Pieterson, Liesbeth ; Van Os, Koen
Author_Institution :
Dept. of Lighting & Cleantech Incubator, Inst. of Philips Res., Eindhoven, Netherlands
Volume :
2
Issue :
1
fYear :
2012
Firstpage :
165
Lastpage :
168
Abstract :
We present a simple fabrication process that produces reliable electronic textile backplanes. We electroplate copper onto woven conductive yarns in order to improve the yarn´s conductivity as well as the reliability of electrical contact points between the conductive warp and weft yarns. This process improves the electrical performance of the woven yarns and of the warp/weft contacts by a factor of 1.22 and 3.63, respectively. Also, in mechanical tests, the electroplated textiles show improved electrical performance when subjected to mechanical strain. Furthermore, we use this process to mount electronic submounts onto the textile substrate on top of which electronic components could be easily connected, thereby creating an electronic textile backplane.
Keywords :
electroplated coatings; reliability; textiles; woven composites; conduction reliability; electronic submounts; electronic textile backplanes; electroplate copper; fabrication process; mechanical reliability; woven conductive yarns; woven metal interconnects; Contacts; Copper; Resistance; Substrates; Weaving; Yarn; Electronic textile; interconnect; plating; reliability;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2011.2171041
Filename :
6092472
Link To Document :
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