DocumentCode :
1385255
Title :
Composition monitoring for one year of lube cross-contamination of hard disks using aluminum substrates
Author :
Noda, Kohki ; Naoe, Masahiko
Author_Institution :
Res. Lab., IBM Japan Ltd., Tokyo, Japan
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3708
Lastpage :
3710
Abstract :
The possibility of chemical reactions between different lubes for hard disks is a concern that should be investigated to ensure a high level of quality for hard disk drives when the same assembly process is used for different drives. To investigate cross-contamination by different disk lubes, a novel characterization method was developed, using an aluminum disk substrate with an Ni-P underlayer as a witness disk, instead of the silicon wafers currently used. One-year monitoring of organic and ionic materials in a clean room for manufacturing lines showed that the method had good detection ability and operability. It was also confirmed that lube cross-contamination was below the level at which it could cause chemical reactions between lubes
Keywords :
aluminium; hard discs; lubrication; magnetic recording; Al; Ni-P underlayer; aluminum substrate; chemical reaction; clean room; composition monitoring; hard disk drive; ionic material; lube cross-contamination; manufacturing line; organic material; witness disk; Aluminum; Assembly; Chemical technology; Cleaning; Hard disks; Manufacturing processes; Monitoring; Silicon; Substrates; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538811
Filename :
538811
Link To Document :
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