Title :
An AFM study of environmental contaminants and lubricant morphology on the magnetic hard-disk surface
Author :
Chekanov, A.S. ; Low, T.S. ; Alli, S. ; Agarwal, S. ; Smith, S.
Author_Institution :
Magnetics Technol. Centre, Nat. Univ. of Singapore, Singapore
fDate :
9/1/1996 12:00:00 AM
Abstract :
Atomic Force Microscopy (AFM) was used to study some common hard-disk drive environmental contaminants. Possibility of application of AFM for the detection and characterization of the organic contaminants on the disk surface was demonstrated. Effects of contaminants on morphology of lubricant film are discussed
Keywords :
atomic force microscopy; friction; hard discs; impurities; lubrication; magnetic recording; surface contamination; surface topography; AFM study; atomic force microscopy; environmental contaminants; lubricant film; lubricant morphology; magnetic hard-disk surface; organic contaminants; Atomic force microscopy; Atomic measurements; Force measurement; Glass; Lubricants; Pollution measurement; Surface contamination; Surface morphology; Surface topography; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
