DocumentCode
1385349
Title
A new wear measurement technique for pseudo-contact magnetic recording heads
Author
Hsia, Yiao-Tee ; Rottmayer, Robert ; Donovan, Mark J.
Author_Institution
Read-Rite Corp., Fremont, CA, USA
Volume
32
Issue
5
fYear
1996
fDate
9/1/1996 12:00:00 AM
Firstpage
3750
Lastpage
3752
Abstract
Pseudo-Contact magnetic recording sliders remain in contact with the disk even at operating speeds. The continuous contact can cause wear of the interface that might eventually lead to failure of the drive. In order to evaluate the long term reliability, precise measurements of the slider wear are necessary. In this paper, a new method of measuring the depth and location of wear on the slider is described. Fiduciary marks are created on the slider air-bearing surface using a focused ion beam (FIB). These FIB marks are characterized using an AFM before and after a wear test. The technique allows measurement of wear depths within an accuracy of ±1 nm. Some additional techniques for detecting slider wear are described
Keywords
atomic force microscopy; focused ion beam technology; magnetic heads; magnetic recording; mechanical variables measurement; wear testing; AFM; device failure; disk; fiduciary mark; focused ion beam; pseudo-contact magnetic recording head; reliability; slider; wear measurement; Cascading style sheets; Magnetic heads; Magnetic recording; Manufacturing processes; Measurement techniques; Position measurement; Rough surfaces; Surface roughness; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.538825
Filename
538825
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