• DocumentCode
    1385349
  • Title

    A new wear measurement technique for pseudo-contact magnetic recording heads

  • Author

    Hsia, Yiao-Tee ; Rottmayer, Robert ; Donovan, Mark J.

  • Author_Institution
    Read-Rite Corp., Fremont, CA, USA
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3750
  • Lastpage
    3752
  • Abstract
    Pseudo-Contact magnetic recording sliders remain in contact with the disk even at operating speeds. The continuous contact can cause wear of the interface that might eventually lead to failure of the drive. In order to evaluate the long term reliability, precise measurements of the slider wear are necessary. In this paper, a new method of measuring the depth and location of wear on the slider is described. Fiduciary marks are created on the slider air-bearing surface using a focused ion beam (FIB). These FIB marks are characterized using an AFM before and after a wear test. The technique allows measurement of wear depths within an accuracy of ±1 nm. Some additional techniques for detecting slider wear are described
  • Keywords
    atomic force microscopy; focused ion beam technology; magnetic heads; magnetic recording; mechanical variables measurement; wear testing; AFM; device failure; disk; fiduciary mark; focused ion beam; pseudo-contact magnetic recording head; reliability; slider; wear measurement; Cascading style sheets; Magnetic heads; Magnetic recording; Manufacturing processes; Measurement techniques; Position measurement; Rough surfaces; Surface roughness; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538825
  • Filename
    538825