DocumentCode :
1385422
Title :
Estimation of uncertainty regarding soil breakdown parameters
Author :
Asimakopoulou, Fani E ; Gonos, I.F. ; Stathopulos, I.A.
Author_Institution :
High Voltage Lab., Nat. Tech. Univ. of Athens, Athens, Greece
Volume :
5
Issue :
1
fYear :
2011
fDate :
1/1/2011 12:00:00 AM
Firstpage :
14
Lastpage :
20
Abstract :
The behaviour of a grounding system under fault currents differs from its steady-state behaviour. It has been observed that, when a high impulse current is injected into the grounding system, its impulse impedance drops because of the ionisation phenomenon. The critical parameter for the ionisation phenomenon is the soil critical electric field, which corresponds to the electric field threshold above which the soil ionisation occurs. In bibliography various attempts have been made aiming at its estimation. However, a physical quantity is determined not only by its value, but also by an estimation of the uncertainty. The aim of this work is the analysis of the components of uncertainty and the estimation of the uncertainty regarding the determination of the breakdown voltage associated with the soil critical electric field. Therefore a series of measurements has been conducted by subjecting dry and wet soil samples to impulse voltages, while recording the voltage and the current. Based on these measurements the random uncertainty is calculated while an estimation of the systematic uncertainty is given taking into account the measuring equipment.
Keywords :
earthing; electric breakdown; electric current measurement; electric field measurement; fault currents; measurement uncertainty; soil; voltage measurement; breakdown voltage determination; current measurement; electric field threshold; fault current; grounding system; impulse current; impulse impedance; impulse voltage measurement; soil breakdown parameter; soil critical electric field; soil ionisation; steady-state behaviour; uncertainty estimation;
fLanguage :
English
Journal_Title :
Science, Measurement & Technology, IET
Publisher :
iet
ISSN :
1751-8822
Type :
jour
DOI :
10.1049/iet-smt.2010.0021
Filename :
5641661
Link To Document :
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