An SET-Free, All-Digital Controlled Point-of-Load Regulator for Next-Generation Power Systems: ADC-POL

Author

Adell, Philippe C. ; Liu, Tao ; Vermeire, Bert ; Bakkaloglu, Bertan ; Aveline, David

Author_Institution

Jet Propulsion Lab., Pasadena, CA, USA

Volume

58

Issue

6

fYear

2011

Firstpage

3011

Lastpage

3017

Abstract

This paper presents a digitally controlled programmable point-of-load regulator for next-generation power systems. A novel digital control scheme was designed to minimize single-event effect (SEE)-induced transient effects. By effectively programming the loop transmission, the POL can trade off transient response time with SET robustness. The IC works with 1 to 5.5 V input voltage, 1-4.5V regulated output voltage, high efficiency (peak efficiency at 94%) and power of up to 5 W. The design was fabricated in the AMI i2t100 0.7 μm complimentary, metal-oxide semiconductor (CMOS) process and characterized with the Jet Propulsion Laboratory (JPL) pulsed laser system.

Keywords

CMOS digital integrated circuits; digital control; ADC-POL; CMOS process; IC; JPL pulsed laser system; Jet Propulsion Laboratory pulsed laser system; SEE-induced transient effects; SET robustness; all-digital controlled point-of-load regulator; complimentary metal-oxide semiconductor process; loop transmission; next-generation power systems; single-event effect-induced transient effects; size 0.7 mum; voltage 1 V to 5.5 V; Digital control; Power distribution; Radiation hardening; Regulators; Single event transient; Transient analysis; Digital control; power distribution; radiation hardening; single event transients (SETs);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2011.2172459

Filename

6092518