Title :
Corroborating cutoff frequency measurements with DC gain measurements
Author :
Jenkins, Keith A.
Author_Institution :
IBM Thomas, J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
6/1/1991 12:00:00 AM
Abstract :
A test for the correct measurement of the cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by a network analyzer, and by DC current measurements. The method is described, and sample data are shown to demonstrate its practical application
Keywords :
bipolar transistors; electric current measurement; frequency measurement; gain measurement; network analysers; semiconductor device testing; DC current measurements; DC gain measurements; bipolar transistors; current gain; cutoff frequency measurements; network analyzer; Bipolar transistors; Current measurement; Cutoff frequency; Electric variables measurement; Frequency measurement; Frequency response; Gain measurement; Particle measurements; Scattering parameters; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
