• DocumentCode
    1385602
  • Title

    Corroborating cutoff frequency measurements with DC gain measurements

  • Author

    Jenkins, Keith A.

  • Author_Institution
    IBM Thomas, J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    40
  • Issue
    3
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    642
  • Lastpage
    644
  • Abstract
    A test for the correct measurement of the cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by a network analyzer, and by DC current measurements. The method is described, and sample data are shown to demonstrate its practical application
  • Keywords
    bipolar transistors; electric current measurement; frequency measurement; gain measurement; network analysers; semiconductor device testing; DC current measurements; DC gain measurements; bipolar transistors; current gain; cutoff frequency measurements; network analyzer; Bipolar transistors; Current measurement; Cutoff frequency; Electric variables measurement; Frequency measurement; Frequency response; Gain measurement; Particle measurements; Scattering parameters; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.87035
  • Filename
    87035
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1385602