DocumentCode :
1385674
Title :
Secondary electron beam loading
Author :
Mihran, T.G.
Author_Institution :
General Electric Research Laboratory, The Knolls Schenectady, N. Y.
Issue :
1
fYear :
1952
Firstpage :
16
Lastpage :
19
Abstract :
Beam loading plays an important part in the determination of the power gain and efficiency of klystrons; hence it is desirable to have an accurate theoretical knowledge of this phenomenon. The usual beam loading analysis considers only the loading effects of a d-c beam of primary electrons on a resonator. It can be shown that these electrons effectively change the shunt impedance of the resonator and shift its resonant frequency1. However, if this magnitude of this effect is subject to investigation in a resonator with grids, it is found that observed beam loading is many times more severe than primary theory predicts2,3.
Keywords :
Acceleration; Cavity resonators; Equations; Klystrons; Loading; Q measurement; Silicon compounds;
fLanguage :
English
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
Publisher :
ieee
ISSN :
0197-6370
Type :
jour
DOI :
10.1109/IREPGED.1952.6811053
Filename :
6811053
Link To Document :
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