Title :
On the shot effect of p-n junctions
Author :
Anderson, Richard L. ; van der Ziel, A.
Author_Institution :
Dept. of Electrical Engineering, University of Minnesota; I.B.M. Corporation, Poughskeepsie, New York
Abstract :
Noise measurements on two p-n junctions, biased in the forward direction, have been carried out between 1 kc and 64 kc for a wide range of currents (0–1000 μA). Several other properties of the junction which might help in interpreting our noise data were also measured. Both junctions were almost identical.
Keywords :
Current measurement; Electrical resistance measurement; Noise; P-n junctions; Resistance; Temperature measurement;
Journal_Title :
Electron Devices, Transactions of the IRE Professional Group on
DOI :
10.1109/IREPGED.1952.6811054
