Title :
Single-electron device simulation
Author :
Scholze, Andreas ; Schenk, A. ; Fichtner, Wolfgang
Author_Institution :
Integrated Syst. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
fDate :
10/1/2000 12:00:00 AM
Abstract :
A three-dimensional (3-D) simulator is presented which uses a linear-response approach to simulate the conductance of semiconductor single-electron transistors at the solid-state level. The many-particle groundstate of the quantum dot, weakly connected to the drain and the source reservoir, is evaluated in a self-consistent manner including quantum-mechanical many-body interactions. A transfer-Hamiltonian approach is used to compute the tunneling rates for the coupling of the quantum dot levels to the macroscopic reservoirs on the basis of realistic barrier potentials. The simulator was applied to a GaAs/AlGaAs example structure. We discuss the conductance characteristic and the capacitances as well as the microscopic structure of the quantum dot
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; many-body problems; semiconductor device models; semiconductor quantum dots; single electron transistors; tunnelling; GaAs-AlGaAs; barrier potentials; capacitance; conductance characteristic; device simulation; linear-response approach; macroscopic reservoirs; many-particle groundstate; quantum dot levels; quantum-mechanical many-body interactions; single-electron devices; solid-state level; three-dimensional simulator; transfer-Hamiltonian approach; tunneling rates; Computational modeling; Gallium arsenide; Quantum computing; Quantum dots; Reservoirs; Single electron devices; Single electron transistors; Solid modeling; Solid state circuits; Tunneling;
Journal_Title :
Electron Devices, IEEE Transactions on