• DocumentCode
    1385796
  • Title

    Growth of oriented rare-earth-transition-metal thin films

  • Author

    Fullerton, Eric E. ; Sowers, C.H. ; Wu, X.Z. ; Bader, S.D.

  • Author_Institution
    Div. of Mater. Sci., Argonne Nat. Lab., IL, USA
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    4434
  • Lastpage
    4436
  • Abstract
    Rare-earth-transition-metal thin films are successfully grown by magnetron sputtering onto single-crystal MgO substrates with epitaxial W buffer layers. The use of epitaxial W buffer layers allows oriented single-phase films to be grown. Sm-Co films grown onto W(100), have strong in-plane anisotropy and coercivities exceeding 5 T at 5 K whereas Fe-Sm films have strong perpendicular anisotropy and are magnetically soft
  • Keywords
    cobalt alloys; coercive force; iron alloys; magnetic anisotropy; magnetic epitaxial layers; metallic epitaxial layers; perpendicular magnetic anisotropy; samarium alloys; soft magnetic materials; sputter deposition; 5 K; 5 T; Fe-Sm; FeSm-W-MgO; MgO; MgO substrates; Sm-Co; SmCo-W-MgO; W epitaxial buffer layers; coercivity; in-plane anisotropy; magnetically soft materials; magnetron sputtering; oriented single-phase films; perpendicular anisotropy; rare-earth-transition-metal thin films; Buffer layers; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetosphere; Perpendicular magnetic anisotropy; Sputtering; Substrates; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538892
  • Filename
    538892