DocumentCode :
1385814
Title :
Monte Carlo simulation of noncubic symmetry semiconducting materials and devices
Author :
Brennan, Kevin F. ; Bellotti, Enrico ; Farahmand, Maziar ; Nilsson, Hans-Erik ; Ruden, P.Paul ; Zhang, Yumin
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
Volume :
47
Issue :
10
fYear :
2000
fDate :
10/1/2000 12:00:00 AM
Firstpage :
1882
Lastpage :
1890
Abstract :
In this paper, we discuss the complexities that arise in Monte Carlo based modeling of noncubic symmetry semiconductors and their related devices. We have identified three general issues, band structure, scattering mechanisms, and band intersections that require some modification of the Monte Carlo simulator from that for cubic symmetry. Owing to the increased size and number of atoms per unit cell, the band structure is far more complex in noncubic than in zincblende phase semiconductors. This added complexity is reflected by the greater number of bands, smaller Brillouin zone and concomitant increase in the number of band intersections. We present strategies for modeling the effects of band intersections on the carrier dynamics using the Monte Carlo method. It is found that the band intersection points greatly affect the carrier transport, most dramatically in the determination of the impact ionization and breakdown properties of devices and bulk material. Excellent agreement with experimental measurements of the impact ionization coefficients is obtained only when treatment of the band intersections is included within the model
Keywords :
Brillouin zones; Monte Carlo methods; band structure; crystal symmetry; impact ionisation; semiconductor device models; wide band gap semiconductors; Brillouin zone; Monte Carlo simulation; band intersection; band structure; carrier dynamics; carrier scattering; carrier transport; electric breakdown; impact ionization; noncubic symmetry; semiconducting device model; wide band gap semiconducting material; Electric breakdown; Impact ionization; Monte Carlo methods; Photonic band gap; Semiconductivity; Semiconductor materials; Silicon; Temperature; Thermal conductivity; Wideband;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.870567
Filename :
870567
Link To Document :
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