• DocumentCode
    1385840
  • Title

    Hybrid fullband cellular automaton/Monte Carlo approach for fast simulation of charge transport in semiconductors

  • Author

    Saraniti, Marco ; Goodnick, Stephen M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1909
  • Lastpage
    1916
  • Abstract
    We present a fullband cellular automaton (CA) code for simulation of electron and hole transport in Si and GaAs. In this implementation, the entire Brillouin zone is discretized using a nonuniform mesh in k-space, and a transition table is generated between all initial and final states on the mesh, greatly simplifying the final state selection of the conventional Monte Carlo algorithm. This method allows for fully anisotropic scattering rates within the fullband scheme, at the cost of increased memory requirements for the transition table itself. Good agreement is obtained between the CA model and previously reported results for the velocity-field characteristics and high field distribution function, which illustrate the potential accuracy of the technique. A hybrid CA/Monte Carlo algorithm is introduced which helps alleviate the memory problems of the CA method while preserving the speed up and accuracy
  • Keywords
    Brillouin zones; Monte Carlo methods; cellular automata; electronic engineering computing; gallium arsenide; scattering; semiconductors; silicon; transport processes; Brillouin zone discretization; GaAs; Monte Carlo algorithm; Si; charge transport; electron transport; fast simulation; fullband cellular automaton code; fully anisotropic scattering rates; hole transport; hybrid fullband CA/Monte Carlo approach; nonuniform mesh; semiconductors; state selection; transition table generation; Anisotropic magnetoresistance; Automata; Brillouin scattering; Computational modeling; Costs; Electromagnetic compatibility; Mesh generation; Monte Carlo methods; Particle scattering; Phonons;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.870571
  • Filename
    870571