Title :
CMOS and Memristor-Based Neural Network Design for Position Detection
Author :
Ebong, Idongesit E. ; Mazumder, Pinaki
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
6/1/2012 12:00:00 AM
Abstract :
Most hardware neural networks have a basic competitive learning rule on top of a more involved processing algorithm. This work highlights two basic learning rules/behavior: winner-take-all (WTA) and spike-timing-dependent plasticity (STDP). It also gives a design example implementing WTA combined with STDP in a position detector. A complementary metal-oxide-semiconductor (CMOS) and a memristor-MOS technology (MMOST) design simulation results are compared on the bases of power, area, and noise handling capabilities. Design and layout were done in 130-nm IBM process for CMOS, and the HSPICE model files for the process were used to simulate the CMOS part of the MMOST design. CMOS consumes area, 55-W max power, and requires a 3-dB SNR. On the other hand, the MMOST design consumes , 15-W max power, and requires a 4.8-dB SNR. There is a potential to improve upon analog computing with the adoption of MMOST designs.
Keywords :
CMOS integrated circuits; electronic engineering computing; integrated circuit design; learning (artificial intelligence); memristors; neural nets; CMOS neural network design; IBM process; MMOST design simulation; STDP; WTA; competitive learning rule; complementary metal-oxide-semiconductor neural network design; memristor-MOS technology design simulation; memristor-based neural network design; noise handling capabilities; position detection; power 15 muW; power 55 muW; size 130 nm; spike-timing-dependent plasticity; winner-take-all; Biological neural networks; CMOS integrated circuits; Memristors; Nanoscale devices; Neural networks; Neuromorphics; Resistance; Unsupervised learning; Neural network applications; neural networks; spike-timing-dependent plasticity (STDP); unsupervised learning; winner-take-all (WTA);
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2011.2173089