• DocumentCode
    1386279
  • Title

    Evaluation of Atomic Electron Binding Energies for Monte Carlo Particle Transport

  • Author

    Pia, Maria Grazia ; Seo, Hee ; Batic, Matej ; Begalli, Marcia ; Kim, Chan Hyeong ; Quintieri, Lina ; Saracco, Paolo

  • Author_Institution
    INFN, Sezione di Genova, Genova, Italy
  • Volume
    58
  • Issue
    6
  • fYear
    2011
  • Firstpage
    3246
  • Lastpage
    3268
  • Abstract
    A survey of atomic binding energies used by general purpose Monte Carlo systems is reported. Various compilations of these parameters have been evaluated; their accuracy is estimated with respect to experimental data. Their effects on physical quantities relevant to Monte Carlo particle transport are highlighted: X-ray fluorescence emission, electron and proton ionization cross sections, and Doppler broadening in Compton scattering. The effects due to different binding energies are quantified with respect to experimental data. Among the examined compilations, EADL is found in general a less suitable option to optimize simulation accuracy; other compilations exhibit distinctive capabilities in specific applications, although in general their effects on simulation accuracy are rather similar. The results of the analysis provide quantitative ground for the selection of binding energies to optimize the accuracy of Monte Carlo simulation in experimental use cases. Recommendations on software design dealing with these parameters and on the improvement of data libraries for Monte Carlo simulation are discussed.
  • Keywords
    Compton effect; Doppler broadening; Monte Carlo methods; atom-electron collisions; atom-ion collisions; binding energy; electron impact ionisation; fluorescence; inner-shell ionisation; transport processes; Compton scattering; Doppler broadening; EADL; Monte Carlo particle transport; X-ray fluorescence emission; atomic electron binding energies; electron ionization cross section; optimize simulation; proton ionization cross section; software design; Electron emission; Ionization; Monte Carlo methods; Simulation; Geant4; Monte Carlo; PIXE; X-ray fluorescence; ionization; simulation;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2172458
  • Filename
    6093871