DocumentCode
1386473
Title
Test pattern generation for API faults in RAM
Author
De Jong, Petra ; Van de Goor, Ad J.
Author_Institution
Volmac Networks bv, Woerden, Netherlands
Volume
37
Issue
11
fYear
1988
fDate
11/1/1988 12:00:00 AM
Firstpage
1426
Lastpage
1428
Abstract
The algorithm for detecting pattern-sensitive faults in memories, as presented by K.K. Salnja, K. Kinoshita (ibid., vol.34, no.3, p.284-7, 1985), is simplified. In addition, a new algorithm is presented which has a near optimal WRITE sequence
Keywords
automatic testing; fault location; integrated circuit testing; integrated memory circuits; random-access storage; API faults; BIST; Hamiltonian paths; RAM; near optimal WRITE sequence; pattern-sensitive faults; test pattern generation; Fault detection; Hydrogen; Interference; Random access memory; Read-write memory; Test pattern generators; Testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.8710
Filename
8710
Link To Document