Title :
Comprehensive Error Analysis of Multi-Antenna Decode-and-Forward Relay in Fading Channels
Author :
Datta, Soumendra Nath ; Chakrabarti, Saswat ; Roy, Rajarshi
Author_Institution :
G.S. Sanyal Sch. of Telecommun., IIT Kharagpur, Kharagpur, India
fDate :
1/1/2012 12:00:00 AM
Abstract :
A comprehensive analytical framework of dual-hop fixed decode-and-forward cooperative networks with multi-antenna relay and distributed spatial diversity is developed over generalized Nakagami-m fading channels. The effect of Rician fading for the relay-destination link has been of special interest. The multi-antenna relay employs selection combining (SC) and the destination adopts distributed SC. Analytical expressions for the cumulative distribution function (CDF) of the end-to-end signal-to-noise ratio (SNR) are derived and used to evaluate the bit error probability (BEP) for coherent and non-coherent binary modulation schemes in a unified manner. Numerical and simulation results are presented to illustrate the impact of the Rician K-factor and Nakagami-m parameter on the end-to-end performance.
Keywords :
Nakagami channels; Rician channels; antenna arrays; cooperative communication; decode and forward communication; diversity reception; error analysis; error statistics; higher order statistics; statistical distributions; BEP; Nakagami-m parameter; Rician fading effect; Rician k-factor parameter; bit error probability; coherent binary modulation schemes; comprehensive error analysis; cumulative distribution function; distributed spatial diversity; dual-hop fixed decode-and-forward cooperative networks; end-to-end signal-to-noise ratio; generalized Nakagami-m fading channels; multiantenna decode-and-forward relay channel; noncoherent binary modulation schemes; relay-destination link; selection combining; Diversity reception; Error analysis; Fading; Relays; Rician channels; Signal to noise ratio; Decode-and-forward relay; Nakagami-m fading; error performance; selection combining; unified expression;
Journal_Title :
Communications Letters, IEEE
DOI :
10.1109/LCOMM.2011.111611.111622
