Measurement of differential carrier lifetime in vertical-cavity surface-emitting lasers

Measurements of differential carrier lifetimes on gain-guided proton-implanted vertical-cavity surface-emitting lasers with device size as a parameter are reported. The lifetimes were obtained from laser impedance measurements and from small-signal modulation optical response at subthreshold currents. A simple small-signal equivalent circuit was used to correct the optical data and to extract the carrier lifetimes from the impedance data. Carrier lifetimes ranged from 4.2 ns at 0.04 mA, to about 0.6 ns at a bias close to threshold. The measured carrier lifetimes were used to calculate the corresponding threshold carrier density (n/sub th//spl sim/6/spl times/10/sup 18/ cm/sup -3/) and recombination parameters.