Title :
High-Q and low-loss matching network elements for RF and microwave circuits
fDate :
9/1/2000 12:00:00 AM
Abstract :
Experimental and theoretical results for microstrip line characteristics are included for several polyimide thicknesses and microstrip conductor widths. A closed-form expression for the equivalent dielectric constant of a multilayer dielectric structure is also derived to use with commercial CAD tools to design MMICs. Test data is also included for compact inductors processed using multilayer and multilevel plating on GaAs
Keywords :
III-V semiconductors; MMIC; UHF integrated circuits; circuit CAD; gallium arsenide; impedance matching; inductors; microstrip lines; CAD tools; GaAs; MMICs; closed-form expression; compact inductors; equivalent dielectric constant; low-loss matching network elements; microstrip conductor widths; microstrip line characteristics; microwave circuits; multilayer dielectric structure; multilevel plating; polyimide thicknesses; Closed-form solution; Conductors; Design automation; Dielectric constant; MMICs; Microstrip; Nonhomogeneous media; Polyimides; Radio frequency; Testing;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/6668.871190
