DocumentCode
1386963
Title
High-Q and low-loss matching network elements for RF and microwave circuits
Author
Bahl, Inder J.
Volume
1
Issue
3
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
64
Lastpage
73
Abstract
Experimental and theoretical results for microstrip line characteristics are included for several polyimide thicknesses and microstrip conductor widths. A closed-form expression for the equivalent dielectric constant of a multilayer dielectric structure is also derived to use with commercial CAD tools to design MMICs. Test data is also included for compact inductors processed using multilayer and multilevel plating on GaAs
Keywords
III-V semiconductors; MMIC; UHF integrated circuits; circuit CAD; gallium arsenide; impedance matching; inductors; microstrip lines; CAD tools; GaAs; MMICs; closed-form expression; compact inductors; equivalent dielectric constant; low-loss matching network elements; microstrip conductor widths; microstrip line characteristics; microwave circuits; multilayer dielectric structure; multilevel plating; polyimide thicknesses; Closed-form solution; Conductors; Design automation; Dielectric constant; MMICs; Microstrip; Nonhomogeneous media; Polyimides; Radio frequency; Testing;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/6668.871190
Filename
871190
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