• DocumentCode
    1386981
  • Title

    Analysis of a 5.5-V Class-D Stage Used in + 30-dBm Outphasing RF PAs in 130- and 65-nm CMOS

  • Author

    Fritzin, Jonas ; Svensson, Christer ; Alvandpour, Atila

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Linköping, Sweden
  • Volume
    59
  • Issue
    11
  • fYear
    2012
  • Firstpage
    726
  • Lastpage
    730
  • Abstract
    This brief presents the design and analysis of a 5.5-V class-D stage used in two fully integrated watt-level, +32.0 and + 29.7 dBm, outphasing RF power amplifiers (PAs) in standard 130- and 65-nm CMOS technologies. The class-D stage utilizes a cascode configuration, driven by an ac-coupled low-voltage driver, to allow a 5.5-V supply in the 1.2-/2.5-V technologies without excessive device voltage stress. The rms electric fields (E) across the gate oxides and the optimal bias point, where the voltage stress is equally divided between the transistors, are computed. At the optimal bias point, the rms E, the power dissipation of the parasitic drain capacitance of the common-source transistors, and the equivalent on-resistances are reduced by approximately 25%, 50%, and 25%, compared to a conventional cascode (inverter) stage. To the authors´ best knowledge, the class-D PAs presented are among the first fully integrated CMOS outphasing PAs reaching +30 dBm and demonstrate state-of-the-art output power and bandwidth.
  • Keywords
    CMOS analogue integrated circuits; driver circuits; power amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; RF power amplifiers; ac-coupled low-voltage driver; cascode configuration; class-D power amplifiers; common-source transistors; equivalent on-resistances; gate oxides; inverter; optimal bias point; outphasing RF PA; parasitic drain capacitance; power dissipation; rms electric fields; size 130 nm; size 65 nm; standard CMOS technologies; voltage 1.2 V; voltage 2.5 V; voltage 5.5 V; voltage stress; Bandwidth; CMOS integrated circuits; Logic gates; Radio frequency; Reliability; Stress; Transistors; Amplifier; CMOS; outphasing;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2012.2228391
  • Filename
    6387587