DocumentCode
1386981
Title
Analysis of a 5.5-V Class-D Stage Used in
30-dBm Outphasing RF PAs in 130- and 65-nm CMOS
Author
Fritzin, Jonas ; Svensson, Christer ; Alvandpour, Atila
Author_Institution
Dept. of Electr. Eng., Linkoping Univ., Linköping, Sweden
Volume
59
Issue
11
fYear
2012
Firstpage
726
Lastpage
730
Abstract
This brief presents the design and analysis of a 5.5-V class-D stage used in two fully integrated watt-level, +32.0 and + 29.7 dBm, outphasing RF power amplifiers (PAs) in standard 130- and 65-nm CMOS technologies. The class-D stage utilizes a cascode configuration, driven by an ac-coupled low-voltage driver, to allow a 5.5-V supply in the 1.2-/2.5-V technologies without excessive device voltage stress. The rms electric fields (E) across the gate oxides and the optimal bias point, where the voltage stress is equally divided between the transistors, are computed. At the optimal bias point, the rms E, the power dissipation of the parasitic drain capacitance of the common-source transistors, and the equivalent on-resistances are reduced by approximately 25%, 50%, and 25%, compared to a conventional cascode (inverter) stage. To the authors´ best knowledge, the class-D PAs presented are among the first fully integrated CMOS outphasing PAs reaching +30 dBm and demonstrate state-of-the-art output power and bandwidth.
Keywords
CMOS analogue integrated circuits; driver circuits; power amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; RF power amplifiers; ac-coupled low-voltage driver; cascode configuration; class-D power amplifiers; common-source transistors; equivalent on-resistances; gate oxides; inverter; optimal bias point; outphasing RF PA; parasitic drain capacitance; power dissipation; rms electric fields; size 130 nm; size 65 nm; standard CMOS technologies; voltage 1.2 V; voltage 2.5 V; voltage 5.5 V; voltage stress; Bandwidth; CMOS integrated circuits; Logic gates; Radio frequency; Reliability; Stress; Transistors; Amplifier; CMOS; outphasing;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2012.2228391
Filename
6387587
Link To Document