DocumentCode :
1386994
Title :
Impact of Random Dopant Fluctuations on the Timing Characteristics of Flip-Flops
Author :
Hassan, Foyzul ; Vanderbauwhede, Wim ; Rodríguez-Salazar, Fernando
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Glasgow, Glasgow, UK
Volume :
20
Issue :
1
fYear :
2012
Firstpage :
157
Lastpage :
161
Abstract :
In this work, we have analyzed the effects of variability, due to random dopant fluctuation (RDF), on the timing characteristics of flip-flops for the future technology generations of 25, 18, and 13 nm, based on extensive Monte Carlo simulations. The results show that RDF has a significant impact on all of the timing parameters and that these parameters do not follow a normal distribution; in particular, they are skewed and exhibit a large tail. Moreover, the dispersion and skewness of the timing parameters increase with technology scaling. The study of the exact shape of these distributions, especially in the tail section, is of fundamental importance in the design and modeling of high-performance, reliable, and economically feasible circuits. In this paper, the distribution tails are estimated based on simulation data, with the aid of statistical nonparametric probability density functions, and it has been found that timing distributions can better be represented by certain nonparametric distributions, in particular Pearson and Johnson systems. The use of these representations during the statistical static timing analysis will provide more accurate results as compared with the normal approximation of distributions and will eventually reduce the probability of yield loss.
Keywords :
Monte Carlo methods; flip-flops; integrated circuit reliability; logic design; nonparametric statistics; normal distribution; timing circuits; Monte Carlo simulation; circuit reliability; flip-flop timing characteristics; high-performance circuit design; high-performance circuit modeling; normal distribution; random dopant fluctuations; size 13 nm; size 18 nm; size 25 nm; statistical nonparametric probability density function; statistical static timing analysis; technology scaling; timing parameters; CMOS integrated circuits; Clocks; Delay; Estimation; Integrated circuit modeling; Resource description framework; Device variability; flip-flops (FFs); nonparametric estimation; parameter fluctuations;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2088409
Filename :
5643206
Link To Document :
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