Structure and properties of sputtered FeMn/NiFe bilayer thin films

Author

Wang, Geng ; Yeh, Tom ; Lin, Chien-Li ; Sivertsen, John M. ; Judy, Jack H.

Author_Institution

Dept. of Chem. Eng. & Mater. Sci., MINT, USA

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

4660

Lastpage

4662

Abstract

The exchange anisotropy and magnetic properties of FeMn/NiFe exchange coupled bilayer thin films with various NiFe [111] crystal axis distributions have been investigated. The exchange anisotropy and magnetic properties of the exchange coupled films have been found to be very sensitive to the dispersion of the NiFe [111] crystal axis, i.e. Δθ₅₀. Higher exchange anisotropy field (H_e) is obtained for the FeMn deposited on the highly oriented NiFe film (Δθ₅₀ of 2.8°). While lower exchange anisotropy field is obtained for the FeMn film deposited on NiFe film having more random [111] crystal axis distribution (Δθ₅₀ of 11.8°). Also, the magnetic characteristics of the exchange coupled films were found to be dependent upon the [111] orientation distributions of the NiFe films. Very low coercivity H_c|| (measured along the easy direction) and large anisotropy field increase (ΔH_k) were found for the sample film of FeMn deposited on highly oriented NiFe film

Keywords

antiferromagnetic materials; coercive force; ferromagnetic materials; iron alloys; magnetic multilayers; nickel alloys; sputtered coatings; FeMn-NiFe; FeMn/NiFe bilayer thin films; NiFe; NiFe [111] crystal axis distributions; coercivity; exchange anisotropy; exchange coupled bilayer thin films; highly oriented NiFe film; magnetic properties; random [111] crystal axis distribution; sample film; Anisotropic magnetoresistance; Antiferromagnetic materials; Coercive force; Couplings; FCC; Giant magnetoresistance; Magnetic field measurement; Magnetic films; Magnetic properties; Sputtering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539110

Filename

539110