DocumentCode
1387624
Title
AC Loss Filamentization of 2G HTS Tapes by Buffer Stack Removal
Author
Majkic, Goran ; Kesgin, Ibrahim ; Zhang, Yue ; Qiao, Yunfei ; Schmidt, Robert ; Selvamanickam, Venkat
Author_Institution
Dept. of Mech. Eng., Univ. of Houston, Houston, TX, USA
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
3297
Lastpage
3300
Abstract
Filamentization of 2G-HTS tapes provides a means for significant reduction of magnetization AC losses in coated conductors. Photolithography followed by dry etching is one of the approaches to `top-down´ filamentization of REBCO (RE=rare earth) and shunt layers. Some of the issues associated with this approach include REBCO undercuts, as well as the complexity and cost of the process. In this work, we present results on a study aimed at developing an alternative, `bottom-up´ filamentization technique that is free of undercuts, has low cost, high throughput and is readily scalable. Here, the buffer tape is striated by mechanically removing thin stripes of the buffer stack, followed by the REBCO Metal Organic Chemical Vapor Deposition (MOCVD) process. We couple this technique with a low cost deposition of the silver shunt layer using electrodeposition instead of sputtering and study the conditions for selective electrodeposition on the superconducting filaments.
Keywords
MOCVD; barium compounds; electrodeposition; high-temperature superconductors; photolithography; superconducting tapes; yttrium compounds; 2G HTS tapes; AC loss filamentization; YBCO; buffer stack removal; buffer tape; coated conductors; dry etching; electrodeposition; magnetization AC losses; metal organic chemical vapor deposition; photolithography; silver shunt layer; sputtering; superconducting filaments; top-down filamentization; Annealing; Conductors; High temperature superconductors; MOCVD; Optical buffering; Scanning electron microscopy; Silver; AC loss; coated conductor; filamentization; striation;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2010.2089416
Filename
5643954
Link To Document