DocumentCode :
1387721
Title :
Performance of MAX family of order-statistic CFAR detectors
Author :
Ritcey, James A. ; Hines, Jeffrey L.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
27
Issue :
1
fYear :
1991
fDate :
1/1/1991 12:00:00 AM
Firstpage :
48
Lastpage :
57
Abstract :
The MAX family of constant-false-alarm-rate (CFAR) detectors is introduced as a generalization of the greatest of CFAR (GO-CFAR) or MX mean-level detector (MX-MLD). Members of the MAX family use local estimators based on order statistics and generate both a near-range and a far-range noise-level estimate. Local estimates are always combined through a maximum operation; this insures false-alarm control at clutter edges. At the same time, order-statistic-based estimators result in a high-resolution detector. A complete detection analysis is provided for SWII targets and a reference channel contaminated by large outliers. Results are presented for the MX censored MLD (MX-CMLD) operating in clutter. The MX order statistic detector (MX-OSD) based on only a single-order statistic per window, is analyzed, and curves showing the required threshold, CFAR loss, optimum censoring point, and signal-to-noise ratio (SNR) loss in the presence of outliers are given. Simulations are used to compare the dynamic responses of various MX-OSD detectors in a clutter and a multiple-target environment
Keywords :
estimation theory; probability; radar clutter; radar theory; signal detection; CFAR loss; MAX; SWII targets; clutter edges; constant false alarm rate detector; detection analysis; digital simulation; dynamic responses; false-alarm; far-range noise-level; local estimators; mean-level detector; multiple-target environment; near range noise; optimum censoring point; order statistic detector; order-statistic CFAR detectors; probability; reference channel; signal-to-noise ratio; single-order statistic; threshold; Background noise; Clutter; Detectors; Face detection; Noise level; Radar detection; Signal analysis; Signal to noise ratio; Statistical analysis; Statistics;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/7.68147
Filename :
68147
Link To Document :
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