A new class of codes in Lee metric and their application to error-correcting modulation codes

Author

Krachkovsky, Victor Yu ; Lee, Yuan Xing ; Davydov, V.A.

Author_Institution

Data Storage Inst., Nat. Univ. of Singapore, Singapore

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

3935

Lastpage

3937

Abstract

A new class of t-error-correcting codes in Lee metric is proposed. For the new codes, unlike the BCH codes in Lee metric, the Galois field characteristic may be chosen independently of t and metric parameter Q. The proposed codes are applied for the bitshift error detection/correction in (d,k)-encoded binary data. The resulting fixed-length error-correcting/modulation code have a regular encoding and can be used for the constraints, imposed by any given FSTD. The 2-shift correcting codes are specially studied. It is shown that both for the finite lengths case and asymptotically these codes outperform the construction based on BCH codes

Keywords

Galois fields; error correction codes; modulation coding; (d,k)-encoded binary data; FSTD; Galois field; Lee metric; bitshift error correction; fixed-length code; t-error-correcting modulation code; Aerospace electronics; Error correction codes; Galois fields; Magnetic noise; Magnetic recording; Memory; Modular construction; Modulation coding; Nonlinear distortion; Redundancy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539222

Filename

539222