Title :
A new class of codes in Lee metric and their application to error-correcting modulation codes
Author :
Krachkovsky, Victor Yu ; Lee, Yuan Xing ; Davydov, V.A.
Author_Institution :
Data Storage Inst., Nat. Univ. of Singapore, Singapore
fDate :
9/1/1996 12:00:00 AM
Abstract :
A new class of t-error-correcting codes in Lee metric is proposed. For the new codes, unlike the BCH codes in Lee metric, the Galois field characteristic may be chosen independently of t and metric parameter Q. The proposed codes are applied for the bitshift error detection/correction in (d,k)-encoded binary data. The resulting fixed-length error-correcting/modulation code have a regular encoding and can be used for the constraints, imposed by any given FSTD. The 2-shift correcting codes are specially studied. It is shown that both for the finite lengths case and asymptotically these codes outperform the construction based on BCH codes
Keywords :
Galois fields; error correction codes; modulation coding; (d,k)-encoded binary data; FSTD; Galois field; Lee metric; bitshift error correction; fixed-length code; t-error-correcting modulation code; Aerospace electronics; Error correction codes; Galois fields; Magnetic noise; Magnetic recording; Memory; Modular construction; Modulation coding; Nonlinear distortion; Redundancy;
Journal_Title :
Magnetics, IEEE Transactions on
