DocumentCode :
138804
Title :
Temperature increment in high voltage copper conductor under various applied current waveforms
Author :
Illias, H. ; Mokhlis, H. ; Ibrahim, M.S.B. ; A. Bakar, A.
Author_Institution :
Dept. of Electr. Eng., Univ. of Malaya, Kuala Lumpur, Malaysia
fYear :
2014
fDate :
24-25 March 2014
Firstpage :
64
Lastpage :
67
Abstract :
Temperature increment in high voltage copper conductors is one of the important parameters that needs to be monitored continuously. This is due to significant temperature rise in the conductor may lead to thermal breakdown, which consequently causing power outage. One of the factors affecting temperature rise in conductors is the applied voltage waveform. In this work, simulation of temperature increment in high voltage conductors under different applied voltage waveform was performed using finite element analysis (FEA) software. From the simulation results, applied voltage waveform which yields the highest temperature increment in high voltage conductors can be identified, which are DC and square waveforms. Triangular waveform yields the lowest temperature increment in the conductor. The results from this work may increase an understanding about heat transfer under different applied current or voltage waveform.
Keywords :
conductors (electric); copper compounds; elemental semiconductors; finite element analysis; heat transfer; power system reliability; FEA; current waveform; current waveforms; finite element analysis software; heat transfer; high voltage copper conductor; power outage; square waveforms; temperature increment simulation; thermal breakdown; triangular waveform; voltage waveform; Conductors; Copper; Heat transfer; Software; Temperature; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering and Optimization Conference (PEOCO), 2014 IEEE 8th International
Conference_Location :
Langkawi
Print_ISBN :
978-1-4799-2421-9
Type :
conf
DOI :
10.1109/PEOCO.2014.6814400
Filename :
6814400
Link To Document :
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