Title :
Micromagnetic study on dynamic properties of write operation in magnetic random access memory cell
Author :
Asada, H. ; Matsuyama, K. ; Taniguchi, K.
Author_Institution :
Dept. of Electr. Eng., Kyushu Univ., Fukuoka, Japan
fDate :
9/1/1996 12:00:00 AM
Abstract :
In a magnetic random access memory using a static differential signal due to the giant magnetoresistance effect, the write operation is performed by the switching of the magnetization direction in the free magnetic layer. The dynamic properties of the write operation in a sub-micron memory cell has been studied by a micromagnetic computation, which is important in order to estimate the power consumption and the access time in the memory. The magnetization switching process performed by step pulse currents have been investigated and the minimum pulse width required for the switching has been clarified. Both the minimum pulse width and the power consumption decreased with an increasing write current amplitude through the selective write operation range. The bit state switching was found to be caused by the incoherent rotation of the magnetization in the fine thin film pattern due to the demagnetization field. The dependence of the switching process on the damping constant is also discussed
Keywords :
demagnetisation; giant magnetoresistance; magnetic film stores; magnetic switching; magnetisation; random-access storage; access time; bit state switching; damping constant; demagnetization field; dynamic properties; free magnetic layer; giant magnetoresistance effect; incoherent rotation; magnetic random access memory cell; magnetization direction; magnetization switching process; micromagnetic computation; minimum pulse width; power consumption; selective write operation; static differential signal; sub-micron memory cell; write current amplitude; write operation; Damping; Demagnetization; Energy consumption; Giant magnetoresistance; Magnetic switching; Magnetization; Micromagnetics; Random access memory; Space vector pulse width modulation; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on