DocumentCode
1388090
Title
Single Frequency Inverse Obstacle Scattering: A Sparsity Constrained Linear Sampling Method Approach
Author
Alqadah, Hatim F. ; Ferrara, Matthew ; Fan, Howard ; Parker, Jason T.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Cincinnati, Cincinnati, OH, USA
Volume
21
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
2062
Lastpage
2074
Abstract
The linear sampling method (LSM) offers a qualitative image reconstruction approach, which is known as a viable alternative for obstacle support identification to the well-studied filtered backprojection (FBP), which depends on a linearized forward scattering model. Of practical interest is the imaging of obstacles from sparse aperture far-field data under a fixed single frequency mode of operation. Under this scenario, the Tikhonov regularization typically applied to LSM produces poor images that fail to capture the obstacle boundary. In this paper, we employ an alternative regularization strategy based on constraining the sparsity of the solution´s spatial gradient. Two regularization approaches based on the spatial gradient are developed. A numerical comparison to the FBP demonstrates that the new method´s ability to account for aspect-dependent scattering permits more accurate reconstruction of concave obstacles, whereas a comparison to Tikhonov-regularized LSM demonstrates that the proposed approach significantly improves obstacle recovery with sparse-aperture data.
Keywords
filtering theory; image reconstruction; sparse matrices; Tikhonov regularization; filtered backprojection; obstacle boundary; obstacle support identification; qualitative image reconstruction; single frequency inverse obstacle scattering; sparsity constrained linear sampling method; Apertures; Electronic mail; Equations; Inverse problems; Mathematical model; Sampling methods; Scattering; Backprojection; inverse scattering; linear sampling method (LSM); sparse regularization; total variation; Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Linear Models; Numerical Analysis, Computer-Assisted; Reproducibility of Results; Sample Size; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2011.2177992
Filename
6094209
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