Title :
A method to measure the complex permeability of thin films at ultra-high frequencies
Author :
Korenivski, V. ; van Dover, R.B. ; Mankiewich, P.M. ; Ma, Z.-X. ; Becker, A.J. ; Polakos, P.A. ; Fratello, V.J.
Author_Institution :
Lucent Technol., Bell Labs., Murray Hill, NJ, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
A swept frequency method for measuring the magnetic permeability of thin films for frequencies up to 2 GHz with a resolution at 1 GHz of ~0.1 μm in permeance is described. It is based on the measurement of impedance of a strip loop loaded with the sample under test. The method employs a commercial impedance or network analyzer, is simple, and suitable for permeability measurements of thin magnetic films which are used in recording heads and microwave components
Keywords :
UHF measurement; magnetic permeability measurement; magnetic thin films; 2 GHz; complex permeability measurement; impedance analyzer; magnetic thin film; microwave component; network analyzer; recording head; resolution; strip loop; swept frequency method; ultra-high frequency; Frequency measurement; Impedance measurement; Magnetic analysis; Magnetic films; Magnetic heads; Magnetic recording; Permeability measurement; Strips; Testing; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
