Title :
Accurate determination of the ordinary index profile of proton-exchanged waveguides
Author :
Marangoni, M. ; Ramponi, R. ; Osellame, R. ; Russo, V.
Author_Institution :
Ist. Nazionale Fisica della Mater., CNR, Milano, Italy
Abstract :
A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed. The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes, and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 /spl mu/m and 0.0001, respectively.
Keywords :
integrated optics; ion exchange; measurement errors; optical prisms; optical testing; optical waveguides; photodetectors; refractive index measurement; accuracy; accurate determination; effective indexes; film refractive index; least squares fitting; optical power coupling; ordinary index profile; ordinary profile; ordinary refractive index profile; proton-exchanged waveguides; radiation modes; Frequency conversion; Geometrical optics; Nonlinear optical devices; Nonlinear optics; Optical devices; Optical films; Optical refraction; Optical variables control; Optical waveguide theory; Optical waveguides;
Journal_Title :
Lightwave Technology, Journal of
