Title :
Measurement of phase and amplitude error distributions in arrayed-waveguide grating multi/demultiplexers based on dispersive waveguide
Author :
Yamada, Hiroaki ; Sanjoh, Hiroaki ; Kohtoku, Masaki ; Takada, Kazumasa ; Okamoto, Katsunari
Author_Institution :
NTT Photonics Lab., Ibaraki, Japan
Abstract :
We measured the phase and amplitude error distributions in InP-based arrayed-waveguide grating (AWG) multi/demultiplexers using Fourier transform spectroscopy with interferogram restoration. The interferogram restoration was used to reduce the effect of the group-velocity dispersion of the waveguide. It was based on a wavenumber scale transformation or a dispersion balance between two arms in the interferometer. We derived a criterion for choosing the appropriate restoration method by estimating the worst-case measurement error in the presence of second order dispersion. After selecting a method using the derived criterion, we obtained isolated fringe patterns, from which we were able to obtain the phase and amplitude distributions in 50 and 200 GHz AWGs. Using the obtained distributions, we examined the origin of the crosstalk and chromatic dispersion in InP-based AWGs. The results revealed that the main origin is phase error as found with SiO/sub 2/-based AWGs.
Keywords :
Fourier transform spectroscopy; III-V semiconductors; demultiplexing; diffraction gratings; indium compounds; integrated optics; interference spectroscopy; measurement errors; multiplexing equipment; optical arrays; optical testing; optical waveguides; InP; InP-based AWGs; InP-based arrayed-waveguide grating multi/demultiplexers; SiO/sub 2/; SiO/sub 2/-based AWGs; amplitude error distributions; arrayed-waveguide grating multi/demultiplexers; dispersion balance; dispersive waveguide; group-velocity dispersion; interferogram restoration; interferometer; measurement error; phase error; phase error distributions; second order dispersion; wavenumber scale transformation; Arrayed waveguide gratings; Crosstalk; Dispersion; Measurement errors; Optical filters; Optical interferometry; Optical waveguides; Phase measurement; Phased arrays; Wavelength division multiplexing;
Journal_Title :
Lightwave Technology, Journal of