• DocumentCode
    1388518
  • Title

    A good puncturing scheme for rate compatible low-density parity-check codes

  • Author

    Choi, Sunghoon ; Yoon, Sungroh ; Sung, Wonjin ; Kwon, Hongkyu ; Heo, Jun

  • Author_Institution
    LG electronics Inc., Seoul, Korea
  • Volume
    11
  • Issue
    5
  • fYear
    2009
  • Firstpage
    455
  • Lastpage
    463
  • Abstract
    We consider the challenges of finding good puncturing patterns for rate-compatible low-density parity-check code (LDPC) codes over additive white Gaussian noise (AWGN) channels. Puncturing is a scheme to obtain a series of higher rate codes from a lower rate mother code. It is widely used in channel coding but it causes performance is lost compared to non-punctured LDPC codes at the same rate. Previous work, considered the role of survived check nodes in puncturing patterns. Limitations, such as single survived check node assumption and simulation-based verification, were examined. This paper analyzes the performance according to the role of multiple survived check nodes and multiple dead check nodes. Based on these analyses, we propose new algorithm to find a good puncturing pattern for LDPC codes over AWGN channels.
  • Keywords
    AWGN; Algorithm design and analysis; Electronic mail; Error probability; Gaussian approximation; Parity check codes; Random variables; block-type LDPC codes (B-LDPC); density evolution (DE); low-density parity-check code (LDPC) codes; puncturing;
  • fLanguage
    English
  • Journal_Title
    Communications and Networks, Journal of
  • Publisher
    ieee
  • ISSN
    1229-2370
  • Type

    jour

  • DOI
    10.1109/JCN.2009.6388389
  • Filename
    6388389