An evanescent-mode tester for ceramic dielectric substrates

Author

Kent, Gordon

Author_Institution

Dielectric Labs. Inc., Cazenovia, NY, USA

Volume

36

Issue

10

fYear

1988

fDate

10/1/1988 12:00:00 AM

Firstpage

1451

Lastpage

1454

Abstract

The TE₀₁ mode in a cylindrical waveguide at a frequency below cutoff is used to probe a ceramic dielectric substrate located on the central plane between input and output cooling loops. Maximum transmission occurs at a frequency determined by the waveguide radius, the substrate thickness, and the dielectric constant. The dielectric constant and loss tangent are obtained from the resonant frequency and the absorption bandwidth. The measurement is insensitive to the position of the substrate in the gap between waveguide sections, and no intimate contact is required

Keywords

ceramics; dielectric devices; dielectric loss measurement; dielectric materials; microwave measurement; permittivity measurement; probes; substrates; test equipment; waveguide components; TE₀₁ mode; absorption bandwidth; ceramic dielectric substrates; cylindrical waveguide; dielectric constant; electric field probe; evanescent-mode tester; loss tangent; microwave measurement; permittivity; resonant frequency; substrate thickness; waveguide radius; Ceramics; Cooling; Cutoff frequency; Dielectric constant; Dielectric losses; Dielectric substrates; Planar waveguides; Probes; Tellurium; Testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.6095

Filename

6095