DocumentCode
1388757
Title
Compensation for the Dynamics Effect on Nanoscale Broadband Viscoelasticity Measurements Using Adaptive Filtering Approach
Author
Xie, Ping ; Xu, Zhonghua ; Zou, Qingze
Author_Institution
Sch. of Electr. Eng., Yanshan Univ., Qinhuangdao, China
Volume
60
Issue
4
fYear
2011
fDate
4/1/2011 12:00:00 AM
Firstpage
1155
Lastpage
1162
Abstract
A large measurement frequency range (i.e., broadband) is desirable in mechanical property measurements; the measurement frequency range, however, is generally limited by the instrument dynamics effect. Such a limit arises due to the convolution of the instrument dynamics with the mechanical response of the material, particularly when the excitation force applied consists of multiple frequencies in the high-frequency range. The contribution of this paper is the utilization of the adaptive filtering approach to compensate for the instrument dynamics effect on nanoscale broadband viscoelasticity measurements using atomic force microscope (AFM). Specifically, the effect of the AFM dynamics convoluted into the measurement data is converted to an additive disturbance through a homomorphic transform, and the measured AFM dynamics response is utilized to generate the reference signal to the adaptive filter. The convergence of the adaptive filter is discussed, and the bound of the adaptive filter coefficient is quantified. The efficacy of the proposed approach is illustrated by implementing it to compensate for the dynamics effect on the broadband viscoelasticity measurement of a polydimethylsiloxane sample using AFM.
Keywords
adaptive filters; atomic force microscopy; force measurement; viscoelasticity; adaptive filtering approach; atomic force microscope; dynamics effect; measurement frequency range; mechanical property measurements; nanoscale broadband viscoelasticity measurements; Adaptive filters; atomic force microscopy; mechanical property measurement; nanotechnology;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2010.2083270
Filename
5645683
Link To Document