• DocumentCode
    1388757
  • Title

    Compensation for the Dynamics Effect on Nanoscale Broadband Viscoelasticity Measurements Using Adaptive Filtering Approach

  • Author

    Xie, Ping ; Xu, Zhonghua ; Zou, Qingze

  • Author_Institution
    Sch. of Electr. Eng., Yanshan Univ., Qinhuangdao, China
  • Volume
    60
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    1155
  • Lastpage
    1162
  • Abstract
    A large measurement frequency range (i.e., broadband) is desirable in mechanical property measurements; the measurement frequency range, however, is generally limited by the instrument dynamics effect. Such a limit arises due to the convolution of the instrument dynamics with the mechanical response of the material, particularly when the excitation force applied consists of multiple frequencies in the high-frequency range. The contribution of this paper is the utilization of the adaptive filtering approach to compensate for the instrument dynamics effect on nanoscale broadband viscoelasticity measurements using atomic force microscope (AFM). Specifically, the effect of the AFM dynamics convoluted into the measurement data is converted to an additive disturbance through a homomorphic transform, and the measured AFM dynamics response is utilized to generate the reference signal to the adaptive filter. The convergence of the adaptive filter is discussed, and the bound of the adaptive filter coefficient is quantified. The efficacy of the proposed approach is illustrated by implementing it to compensate for the dynamics effect on the broadband viscoelasticity measurement of a polydimethylsiloxane sample using AFM.
  • Keywords
    adaptive filters; atomic force microscopy; force measurement; viscoelasticity; adaptive filtering approach; atomic force microscope; dynamics effect; measurement frequency range; mechanical property measurements; nanoscale broadband viscoelasticity measurements; Adaptive filters; atomic force microscopy; mechanical property measurement; nanotechnology;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2083270
  • Filename
    5645683