• DocumentCode
    1388780
  • Title

    A Power Bus With Multiple Via Ground Surface Perturbation Lattices for Broadband Noise Isolation: Modeling and Application in RF-SiP

  • Author

    Hsieh, Chia-Yuan ; Wang, Chuen-De ; Lin, Kun-You ; Wu, Tzong-Lin

  • Author_Institution
    Dept. of Electr. of Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    33
  • Issue
    3
  • fYear
    2010
  • Firstpage
    582
  • Lastpage
    591
  • Abstract
    A model and application of the power bus with multiple via ground surface perturbation lattice (MV-GSPL) is investigated in this paper. A 1-D model especially considering the multiple via effects of the MV-GSPL inside the long period coplanar electromagnetic bandgap power planes (LPC-EBG) is proposed. This model can explain the mechanism of the stopband enhancement and accurately predict the effect of multiple via on the stopband behavior. The accuracy of this model is verified both by full-wave simulation and experiments. Based on this model, a MV-GSPL power/ground pair is designed on a radio-frequency (RF) package for system-in-package (SiP) application. A test C-band LNA fabricated by the TSMC 0.18-μ m 1P6M process is packaged on the MV-GSPL substrate for noise immunity test. Both the chip-package co-simulation and experimental results show excellent power noise isolation capability of the RF-SiP package.
  • Keywords
    low noise amplifiers; radiofrequency amplifiers; system-in-package; 1D model; broadband noise isolation; chip-package co-simulation; full-wave simulation; long period coplanar electromagnetic bandgap power plane; multiple via ground surface perturbation lattice; noise immunity test; power bus; power noise isolation capability; radio-frequency package; stopband enhancement; system-in-package application; test C-band LNA; Electromagnetic bandgap (EBG); ground bounce noise (GBN); high-speed digital circuits; mixed-signal system; simultaneous switching noise (SSN);
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2009.2036858
  • Filename
    5393005