• DocumentCode
    1388782
  • Title

    Analysis of shadow mask thermal deformation and prediction of beam landing shifts for color CRT

  • Author

    Kim, Kug Weon ; Kim, Nam Woong ; Kang, Dae-Jin

  • Author_Institution
    Digital-Media Res. Lab., LG Electron. Inc., Seoul, South Korea
  • Volume
    44
  • Issue
    2
  • fYear
    1998
  • fDate
    5/1/1998 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    450
  • Abstract
    In the cathode ray tube (CRT), beam landing shifts on the phosphor screen mainly result from the thermal deformation of the mask frame assembly and deteriorate the color purity. The thermal deformation of the mask frame assembly is analyzed by using the finite element method (FEM) and the beam landing shifts are predicted. For a realistic analysis, the apparent thermal conductivity and the apparent elastic modulus are calculated and the shadow mask is modeled as a shell without apertures. All the parts inside the CRT are modeled and the each radiative effect is considered. Then finite element analysis is performed for transient thermo-elastic deformation of the mask frame assembly and the beam landing shifts are calculated. Experiments are performed for a 17" CRT to validate the FEM analysis. The temperatures of all parts inside the CRT and the beam landing shift on the panel are measured and the results are discussed in comparison with the results of the FEM analysis. From the study, we show that this analysis method can be applicable for designing a mask frame assembly of a CRT that results in a landing shift of the order of a few micro-meters
  • Keywords
    cathode-ray tube displays; elastic deformation; elastic moduli; emissivity; finite element analysis; temperature measurement; thermal analysis; thermal conductivity; thermoelasticity; 17 inch; FEM analysis; beam landing shift prediction; cathode ray tube; color CRT; color purity; elastic modulus; finite element analysis; finite element method; mask frame assembly; phosphor screen; radiative effect; shadow mask thermal deformation; thermal conductivity; thermal deformation; transient thermo-elastic deformation; Assembly; Cathode ray tubes; Color; Electron beams; Finite element methods; Performance analysis; Phosphors; Temperature; Thermal conductivity; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Consumer Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-3063
  • Type

    jour

  • DOI
    10.1109/30.681963
  • Filename
    681963