Title :
High TX-to-RX Isolation in UHF RFID Using Narrowband Leaking Carrier Canceller
Author :
Xiong, Ting-Wen ; Tan, Xi ; Xi, Jing-Tian ; Min, Hao
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
Ultra-high frequency (UHF) radio frequency identification (RFID) system suffers from large leakage of the carrier due to insufficient TX-to-RX isolation. A narrowband leaking carrier canceller (LCC) for UHF RFID is proposed to enhance the isolation. Hardware realization is carried out based on simulation model in ADS (advanced design system). Measurement results indicate that the TX-to-RX isolation is improved from 20 dB to above 40 dB within UHF RFID frequency band of 920-925 MHz. Upper limit of increase in isolation versus amplitude and phase distortion are also presented and discussed.
Keywords :
UHF integrated circuits; radiofrequency identification; RFID system; TX-to-RX isolation; UHF RFID; advanced design system; frequency 920 MHz to 925 MHz; narrowband leaking carrier canceller; phase distortion; radio frequency identification; ultra-high frequency; Isolation; leaking carrier canceller; radio frequency identification (RFID);
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2009.2038620