Structural, magnetic and magneto-optic properties of MnBiPt thin films

Author

Rüdiger, U. ; Fumagalli, P. ; Dworak, P. ; Güntherodt, G.

Author_Institution

2. Phys. Inst., Tech. Hochschule Aachen, Germany

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

4090

Lastpage

4092

Abstract

C-axis oriented MnBiPt films have been prepared by sequentially depositing Bi, Mn, and Pt layers. The crystalline structure as well as the roughness of the films is strongly influenced due to Pt interlayers. A change from 50 nm sized fragment islands to a plateau-like structure with increasing Pt content coinciding with a shift to higher coercive fields and a decrease in magnetization and Kerr rotation leads to an enhanced reflectivity. The plateau-like structure is observed with scanning force microscopy. The ratio of Kerr rotation to magnetization is constant to within 10% as a function of Pt thickness indicating that Pt does not contribute much to the Kerr effect

Keywords

Kerr magneto-optical effect; atomic force microscopy; bismuth; coercive force; electron beam deposition; magnetic hysteresis; magnetic multilayers; magnetisation; manganese; platinum; reflectivity; surface topography; vacuum deposited coatings; 50 nm; Bi layer; Bi-Mn-Pt-Bi-Mn; Bi/Mn/Pt/Bi/Mn multilayers; Kerr rotation; Mn layer; MnBiPt; MnBiPt thin films; Pt interlayers; Pt layer; Pt thickness; c-axis orientation; crystalline structure; enhanced reflectivity; fragment islands; higher coercive fields; magnetic properties; magnetization; magneto-optic properties; plateau-like structure; roughness; scanning force microscopy; sequential deposition; structural properties; Bismuth; Crystallization; Kerr effect; Magnetic films; Magnetic properties; Magnetization; Magnetooptic effects; Microscopy; Optical films; Reflectivity;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.539308

Filename

539308