• DocumentCode
    1389614
  • Title

    Breakdown features of various microstrip-type gas counter designs and their improvements

  • Author

    Peskov, V. ; Ramsey, B.D. ; Fonte, P.

  • Author_Institution
    NASA Marshall Space Flight Center, Huntsville, AL, USA
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    248
  • Abstract
    Breakdown mechanisms and spurious pulses, the precursors to some breakdowns, were studied experimentally for both uncoated and coated microstrip gas counters (MSGCs) of different geometries, as well as for microgap counters (MGCs) and for the “Compteur A Trou” (CAT). It was found that in all cases the breakdowns occurred through surface streamers, although the exact mechanism of streamer formation depended on the particular detector design. Based on these studies, new designs of microstrip detectors, in which the role of the substrate was minimized, were elaborated and tested. In some of these detectors, especially with large pitches (>2 mm), gains up to 2-3×105 were achieved together with good rate characteristics. The ultimate gain limit in all geometries was still set by spark-inducing streamers which appeared at some critical charge density in the avalanche. To avoid this, and particularly to enhance the performance of small-pitch MSGCs, preamplification structures can be used. Utilizing a parallel plate avalanche chamber as a front end to an MSGC resulted in an overall gain of ~106, limited in this case only by charge saturation
  • Keywords
    avalanche breakdown; position sensitive particle detectors; spark counters; streamer chambers; breakdown features; charge saturation; microgap counters; microstrip-type gas counter designs; parallel plate avalanche chamber; preamplification structures; rate characteristics; spark-inducing streamers; spurious pulses; streamer formation; surface streamers; Anodes; Avalanche breakdown; Counting circuits; Detectors; Dielectric substrates; Electric breakdown; Electron multipliers; Geometry; Microstrip; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.682387
  • Filename
    682387