Simulation of the X-ray response of scintillator coated silicon CCDs

Author

Fröjdh, C. ; Nilsson, H.E. ; Nelvig, P. ; Petersson, C.S.

Author_Institution

REGAM Med. Syst. Int. AB, Sundsvall, Sweden

Volume

45

Issue

3

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

374

Lastpage

378

Abstract

Silicon CCDs are used for X-ray imaging in fields as dentistry and materials testing. Due to the low X-ray absorption in silicon the CCD is generally coated with a scintillating layer. In order to evaluate the response for different combinations of scintillator material, scintillator geometry and detector we have developed a simulation program. The program calculates the signal to noise ratio and spatial resolution based on both the signal from the scintillating layer and the signal from direct detection of X-rays in the detector. Results obtained with this program indicate that the signal to noise ratio in the system is optimized by using a scintillator with high X-ray absorption and high light output while minimizing the signal from direct detection in the CCD. The spatial resolution can be increased by defining pixels in the scintillator

Keywords

X-ray detection; charge-coupled devices; silicon radiation detectors; solid scintillation detectors; Si; Si CCDs; X-ray absorption; X-ray response; pixels; scintillator coated; signal to noise ratio; simulation; spatial resolution; Charge coupled devices; Dentistry; Electromagnetic wave absorption; Signal detection; Signal to noise ratio; Silicon; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.682411

Filename

682411